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KMID : 0381920050350040203
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Korean Journal of Microscopy
2005 Volume.35 No. 4 p.203 ~ p.210
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Mechanism of Stress--dependent Structural Change of Yeast Prx
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강지선/Kang JS
정강원/Cheong GW
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Abstract
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KEYWORD
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Electron microscopy, Peroxiredoxins (Prxs), Thiol-specific antioxidant protein
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FullTexts / Linksout information
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Listed journal information
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